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Josef Sikula

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2000 – 2009

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2008
[j5]
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  - journals/mr/SedlakovaSTM08
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  - https://dblp.org/rec/journals/mr/SedlakovaSTM08
Vlasta Sedlakova, Josef Sikula, Pavel Tofel, Jiri Majzner:
Electro-ultrasonic spectroscopy of polymer-based thick film layers. Microelectron. Reliab. 48(6): 886-889 (2008)
2002
[j4]
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  - journals/mr/PavelkaSVSTH02
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Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi:
Noise and transport characterisation of tantalum capacitors. Microelectron. Reliab. 42(6): 841-847 (2002)
[j3]
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  - journals/mr/VasinaZSP02
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Petr Vasina, T. Zednicek, Josef Sikula, Jan Pavelka:
Failure modes of tantalum capacitors made by different technologies. Microelectron. Reliab. 42(6): 849-854 (2002)
2001
[j2]
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  - journals/mr/SchauerSM01
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P. Schauer, Josef Sikula, Pavel Moravec:
Transport and noise properties of CdTe(Cl) crystals. Microelectron. Reliab. 41(3): 431-436 (2001)
[j1]
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  - journals/mr/RocakBHSKPS01
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Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova:
Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectron. Reliab. 41(4): 531-542 (2001)

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