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Motonobu Tampo

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2010 – 2019

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2019
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Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin-ichiro Abe, Keita Nakano, Hayato Takeshita, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake:
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. IRPS 2019: 1-5

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