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S. A. Wender

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2020 – today

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2022
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  - conf/irps/XiongFPBNBDWWFB22
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Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS 2022: 7

2010 – 2019

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2019
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S. A. Wender, J. M. O'Donnell, Lukas Zavorka, Bharat L. Bhuva:
Neutron Beam Attenuation Through Semiconductor Devices During SEU Testing. IRPS 2019: 1-4

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