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ORCIDMeryem Marzouki
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2000 – 2009
- 2007
[j5]Meryem Marzouki:
Identity control, activity control: from trust to suspicion. Ann. des Télécommunications 62(11-12): 1207-1222 (2007)- 2002
- [j4]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki:
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing. J. Electron. Test. 18(4-5): 455-473 (2002) - 2001
- [j3]Peter Bukovjan, Laurent Ducerf-Bourbon, Meryem Marzouki:
Cost/Quality Trade-off in Synthesis for BIST. J. Electron. Test. 17(2): 109-119 (2001) - [c9]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki:
Testing TAPed cores and wrapped cores with the same test access mechanism. DATE 2001: 150-155 - 2000
- [c8]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki:
CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip. DATE 2000: 141-145 - [c7]Peter Bukovjan, Laurent Ducerf-Bourbon, Meryem Marzouki:
Cost/Quality Trade-Off in Synthesis for BIST. LATW 2000: 110-115 - [c6]Walid Maroufi, Mounir Benabdenbi, Meryem Marzouki:
Solving the I/O Bandwidth Problem in System on a Chip Testing. SBCCI 2000: 9-14
1990 – 1999
- 1997
- [c5]J. Abraham, Phyllis G. Frankl, Christian Landrault, Meryem Marzouki, Paolo Prinetto, Chantal Robach, Pascale Thévenod-Fosse:
Hardware Test: Can We Learn from Software Testing? VTS 1997: 320-321 - 1996
- [j2]Firas Mohamed, Meryem Marzouki:
Test and diagnosis of analog circuits: When fuzziness can lead to accuracy. J. Electron. Test. 9(1-2): 203-216 (1996) - [c4]Vladimir Castro Alves, A. Ribeiro Antunes, Meryem Marzouki:
A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology. Asian Test Symposium 1996: 263-268 - [c3]Firas Mohamed, Meryem Marzouki, Mohamed Hedi Touati:
FLAMES: A Fuzzy Logic ATMS and Model-based Expert System for Analog Diagnosis. ED&TC 1996: 259-263 - [c2]Mohamed Hedi Touati, Firas Mohamed, Meryem Marzouki:
System Fault Diagnosis based on a Fuzzy Qualitative Approach. ED&TC 1996: 616 - 1993
- [c1]Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati:
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657 - 1991
- [b1]Meryem Marzouki:
Approches a base de connaissances pour le test de circuits VLSI : application à la validation de prototypes dans le cadre d'un test sans contact. (Knowledge-based approaches to VLSI circuit testing : application to prototype validation by contactless testing). Grenoble Institute of Technology, France, 1991 - [j1]Meryem Marzouki:
Model-based reasoning for electron-beam debugging of VLSI circuits. J. Electron. Test. 2(4): 385-394 (1991)
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