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2010 – 2019
- 2013
[c7]Yuanzhong Paul Zhou, Alan W. Righter, Jean-Jacques Hajjar:
Investigation on effectiveness of series gate resistor in CDM ESD protection designs. ASICON 2013: 1-4
2000 – 2009
- 2005
- [j1]Andrew Olney, Brad Gifford, John Guravage, Alan W. Righter:
Real-world printed circuit board ESD failures. Microelectron. Reliab. 45(2): 287-295 (2005)
1990 – 1999
- 1998
- [c6]Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203 - 1997
- [c5]J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca:
iDD Pulse Response Testing Applied to Complex CMOS ICs. ITC 1997: 32-39 - 1996
- [c4]Alan W. Righter, Jerry M. Soden, Richard W. Beegle:
High Resolution IDDQ Characterization and Testing - Practical Issues. ITC 1996: 259-268 - 1995
- [c3]Alan W. Righter:
Solving Known Good Die (and Substrate) Test Issues. ITC 1995: 916 - 1994
- [c2]Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson:
Defect Classes - An Overdue Paradigm for CMOS IC. ITC 1994: 413-425 - 1993
- [c1]Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins:
A General Purpose IDDQ Measurement Circuit. ITC 1993: 642-651
Coauthor Index
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