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2010 – 2019

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2019
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In-Suck Baek, Dewi Kusumaningrum, Lalit Mohan Kandpal, Santosh Lohumi, Changyeun Mo, Moon S. Kim, Byoung-Kwan Cho:
Rapid Measurement of Soybean Seed Viability Using Kernel-Based Multispectral Image Analysis. Sensors 19(2): 271 (2019)

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