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David Avnir
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2010 – 2019
- 2013
- [j9]Mark Pinsky, Amir Zait, Maayan Bonjack, David Avnir:
Continuous symmetry analyses: Cnv and Dn measures of molecules, complexes, and proteins. J. Comput. Chem. 34(1): 2-9 (2013) - 2011
- [j8]Chaim Dryzun, Amir Zait, David Avnir:
Quantitative symmetry and chirality - A fast computational algorithm for large structures: Proteins, macromolecules, nanotubes, and unit cells. J. Comput. Chem. 32(12): 2526-2538 (2011)
2000 – 2009
- 2008
- [j7]Mark Pinsky, David Casanova, Pere Alemany, Santiago Alvarez, David Avnir, Chaim Dryzun, Ziv Kizner, Alexander Sterkin:
Symmetry operation measures. J. Comput. Chem. 29(2): 190-197 (2008) - [j6]Mark Pinsky, Chaim Dryzun, David Casanova, Pere Alemany, David Avnir:
Analytical methods for calculating Continuous Symmetry Measures and the Chirality Measure. J. Comput. Chem. 29(16): 2712-2721 (2008) - 2003
- [j5]Mark Pinsky, Dina Yogev-Einot, David Avnir:
Statistical analysis of the estimation of distance measures. J. Comput. Chem. 24(6): 786-796 (2003)
1990 – 1999
- 1999
- [j4]Yair Salomon, David Avnir:
Continuous symmetry measures: Finding the closest C2-symmetric object or closest reflection-symmetric object using unit quaternions. J. Comput. Chem. 20(8): 772-780 (1999) - 1995
- [j3]Hagit Zabrodsky, Shmuel Peleg, David Avnir:
Symmetry as a Continuous Feature. IEEE Trans. Pattern Anal. Mach. Intell. 17(12): 1154-1166 (1995) - 1994
- [c4]Hagit Zabrodsky, Shmuel Peleg, David Avnir:
Symmetry of fuzzy data. ICPR (1) 1994: 499-504 - 1993
- [c3]Hagit Zabrodsky, Shmuel Peleg, David Avnir:
Completion of occluded shapes using symmetry. CVPR 1993: 678-679 - 1992
- [c2]Hagit Zabrodsky, Shmuel Peleg, David Avnir:
A measure of symmetry based on shape similarity. CVPR 1992: 703-706 - [c1]Hagit Zabrodsky, Shmuel Peleg, David Avnir:
Hierarchical symmetry. ICPR (3) 1992: 9-12 - 1991
- [j2]Yacov Hel-Or, Shmuel Peleg, David Avnir:
Characterization of right-handed and left-handed shapes. CVGIP Image Underst. 53(3): 297-302 (1991)
1980 – 1989
- 1984
- [j1]Shmuel Peleg, Joseph Naor, Ralph Hartley, David Avnir:
Multiple Resolution Texture Analysis and Classification. IEEE Trans. Pattern Anal. Mach. Intell. 6(4): 518-523 (1984)
Coauthor Index
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