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P. Garbossa

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2002
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V. Lista, P. Garbossa, T. Tomasi, Mattia Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa:
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectron. Reliab. 42(9-11): 1389-1392 (2002)

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