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Lukas Kaupp
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2020 – today
- 2024
- [b1]Lukas Kaupp:
Context-Aware Fault Diagnosis in Smart Manufacturing. Darmstadt University of Applied Sciences, Germany, Hochschule Darmstadt 2024 - 2022
- [j3]Heiko Webert
, Tamara Döß, Lukas Kaupp
, Stephan Simons:
Fault Handling in Industry 4.0: Definition, Process and Applications. Sensors 22(6): 2205 (2022) - [j2]Lukas Kaupp
, Bernhard Humm
, Kawa Nazemi
, Stephan Simons:
Autoencoder-Ensemble-Based Unsupervised Selection of Production-Relevant Variables for Context-Aware Fault Diagnosis. Sensors 22(21): 8259 (2022) - 2021
- [j1]Bernhard G. Humm, Hermann Bense, Michael Fuchs, Benjamin Gernhardt, Matthias L. Hemmje, Thomas Hoppe, Lukas Kaupp, Sebastian Lothary, Kai-Uwe Schäfer, Bernhard Thull, Tobias Vogel, Rigo Wenning:
Machine intelligence today: applications, methodology, and technology. Inform. Spektrum 44(2): 104-114 (2021) - 2020
- [c5]Nicola Below, Dirk Burkhardt, Lukas Kaupp, Kawa Nazemi:
A Future Prospect for European Collaboration on Advanced Analytics in Economy and Society. CERC 2020: 414-426 - [c4]Lukas Kaupp
, Heiko Webert, Kawa Nazemi, Bernhard Humm
, Stephan Simons:
CONTEXT: An Industry 4.0 Dataset of Contextual Faults in a Smart Factory. ISM 2020: 492-501 - [c3]Lukas Kaupp
, Kawa Nazemi, Bernhard Humm
:
An Industry 4.0-Ready Visual Analytics Model for Context-Aware Diagnosis in Smart Manufacturing. IV 2020: 350-359 - [c2]Kawa Nazemi, Maike J. Klepsch
, Dirk Burkhardt
, Lukas Kaupp
:
Comparison of Full-text Articles and Abstracts for Visual Trend Analytics through Natural Language Processing. IV 2020: 360-367
2010 – 2019
- 2019
- [c1]Lukas Kaupp
, Ulrich Beez, Jens Hülsmann, Bernhard G. Humm:
Outlier Detection in Temporal Spatial Log Data Using Autoencoder for Industry 4.0. EANN 2019: 55-65 - 2018
- [p1]Ulrich Beez, Lukas Kaupp
, Tilman Deuschel, Bernhard G. Humm, Fabienne Schumann, Jürgen Bock
, Jens Hülsmann:
Context-Aware Documentation in the Smart Factory. Semantic Applications 2018: 163-180
Coauthor Index
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last updated on 2025-01-09 13:04 CET by the dblp team
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