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Joseph Favata

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2018
[j2]
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Joseph Favata, Sina Shahbazmohamadi:
Realistic non-destructive testing of integrated circuit bond wiring using 3-D X-ray tomography, reverse engineering, and finite element analysis. Microelectron. Reliab. 83: 91-100 (2018)
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Bahar Ahmadi, Pouya Tavousi, Joseph Favata, Peiman Shahbeigi-Roodposhti, Rengarajan Pelapur, Sina Shahbazmohamadi:
A novel crowdsourcing platform for microelectronics counterfeit defect detection. Microelectron. Reliab. 88-90: 48-53 (2018)

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