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Y. W. Qi

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2017
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S. Yuan, X. Yao, F. J. Luan, J. G. Shi, Y. W. Qi, W. Gong:
Accurate and rapid modelling of AFM tip morphology through scanning sphere nanoparticles. Int. J. Simul. Process. Model. 12(3/4): 328-337 (2017)

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