default search action

combined dblp search
author search
venue search
publication search

ask others

A. G. Lind

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2017
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/WhitingHLPJLKRX17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/WhitingHLPJLKRX17
Patrick G. Whiting, M. R. Holzworth, A. G. Lind, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren, Y. Xin:
Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 70: 32-40 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.