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Stephen A. Wender

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Journal Articles

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2008
[j2]
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  dblp key:
  - journals/technometrics/HengartnerMTW08
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  persistent URL:
  - https://dblp.org/rec/journals/technometrics/HengartnerMTW08
Nicolas W. Hengartner, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender:
Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. Technometrics 50(1): 8-14 (2008)
2000
[j1]
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Peter Hazucha, Christer Svensson, Stephen A. Wender:
Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process. IEEE J. Solid State Circuits 35(10): 1422-1429 (2000)

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