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Brinda Bhowmick
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2020 – today
- 2024
- [j12]Swapna Bharali, Bijit Choudhuri, Brinda Bhowmick:
Investigation of hetero gate oxide hetero stacked triple metal vertical tunnel FET with variable interface trap charges and temperature. Microelectron. J. 143: 106054 (2024) - [j11]Zohmingliana, Bijit Choudhuri, Brinda Bhowmick:
Analytical modeling of drain current for DG-Graphene Nanoribbon Vertical Tunnel FET. Microelectron. J. 147: 106194 (2024) - [j10]Zohmingliana, Bijit Choudhuri, Brinda Bhowmick:
Design of Dual-Band Rectifier Circuit for RF Energy Harvesting Using Double-Gate Graphene Nanoribbon (GNR) Vertical Tunnel FET. IEEE Trans. Consumer Electron. 70(1): 167-172 (2024) - 2023
- [j9]Ravindra Kumar Maurya, Rajesh Saha, Brinda Bhowmick:
Low to high-frequency noise behavior investigation of steeper sub-threshold swing NC-GeFinFET. Microelectron. J. 131: 105642 (2023) - [j8]Karthik Nasani, Brinda Bhowmick, Puspa Devi Pukhrambam:
Effect of lateral straggle parameter on Hetero Junction Dual Gate Vertical TFET. Microelectron. J. 138: 105845 (2023) - [j7]Ravindra Kumar Maurya, Vivek Kumar, Rajesh Saha, Brinda Bhowmick:
Effect of curie temperature on electrical parameters of NC-FinFET and digital switching application of NC-FinFET. Microelectron. J. 139: 105892 (2023) - 2022
- [j6]Puja Ghosh, Brinda Bhowmick:
Study of variability induced by random dopant fluctuation in Fe DS-SBTFET. Microelectron. J. 125: 105467 (2022) - [j5]Zohmingliana, Bijit Choudhuri, Brinda Bhowmick:
Study the impact of graphene channel over conventional silicon on DC/analog and RF performance of DG dual-material-gate VTFET. Microelectron. J. 128: 105581 (2022) - 2021
- [j4]Vandana Devi Wangkheirakpam, Brinda Bhowmick, Puspa Devi Pukhrambam:
Noise behavior of vertical tunnel FETs under the influence of interface trap states. Microelectron. J. 114: 105124 (2021) - 2020
- [j3]Basab Das, Brinda Bhowmick:
Noise behavior of ferro electric tunnel FET. Microelectron. J. 96: 104677 (2020)
2010 – 2019
- 2019
- [j2]Puja Ghosh, Rupam Goswami, Brinda Bhowmick:
Optimization of ferroelectric tunnel junction TFET in presence of temperature and its RF analysis. Microelectron. J. 92 (2019) - [c2]Puja Ghosh, Brinda Bhowmick:
The Impact of Interface Traps (acceptor/donor) on Fe DS-SBTFET Characteristics. TENCON 2019: 73-77 - 2018
- [c1]Dipjyoti Bisharad, Debakshi Dey, Brinda Bhowmick:
Fast Detection of P, Q, S and T Waves from Normal ECG Signals Using Local Context Windows. RCAR 2018: 427-432 - 2016
- [j1]Rupam Goswami, Brinda Bhowmick, Srimanta Baishya:
Effect of scaling on noise in Circular Gate TFET and its application as a digital inverter. Microelectron. J. 53: 16-24 (2016)
Coauthor Index
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last updated on 2024-10-07 22:19 CEST by the dblp team
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