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Conference and Workshop Papers
- 2021
[c11]Qiushi Wang, Hian-Leng Chan:
Generating Pool of Classifiers with Hyper-Parameter Optimization for Ensemble. IECON 2021: 1-6- [c10]Qiushi Wang, Abhishek Gupta, Hian-Leng Chan:
Accelerating Task Completion in IIoT Based Smart Factory Through Optimal Restart. IECON 2021: 1-6 - 2019
- [c9]Jihoon Hong, Qiushi Wang, Xueheng Qiu, Hian-Leng Chan:
Remaining Useful Life Prediction Using Time-Frequency Feature and Multiple Recurrent Neural Networks. ETFA 2019: 916-923 - 2017
- [c8]Jakob Kinghorst, Omid Geramifard, Ming Luo, Hian-Leng Chan, Khoo Yong, Jens Folmer, Minjie Zou, Birgit Vogel-Heuser:
Hidden Markov model-based predictive maintenance in semiconductor manufacturing: A genetic algorithm approach. CASE 2017: 1260-1267 - [c7]Chong Zhang
, Geok Soon Hong, Huan Xu, Kay Chen Tan, Jun-Hong Zhou, Hian-Leng Chan, Haizhou Li:
A data-driven prognostics framework for tool remaining useful life estimation in tool condition monitoring. ETFA 2017: 1-8 - 2016
- [c6]Omid Geramifard, Yi Zhi Zhao, Chua Yong Quan, Hian-Leng Chan, Xiang Li:
Power-signature-based Bayesian multi-classifier for operation mode identification. ETFA 2016: 1-6 - 2015
- [c5]Josey Mathew, Ming Luo, Chee Khiang Pang, Hian-Leng Chan:
Kernel-based SMOTE for SVM classification of imbalanced datasets. IECON 2015: 1127-1132 - 2014
- [c4]Tung Le, Ming Luo, Junhong Zhou, Hian-Leng Chan:
Predictive maintenance decision using statistical linear regression and kernel methods. ETFA 2014: 1-6 - 2013
- [c3]Ming Luo, Zhao Xu, Hian-Leng Chan, Marjan Alavi:
Online predictive maintenance approach for semiconductor equipment. IECON 2013: 3662-3667 - 2010
- [c2]Kevin Shen-Hoong Ong, Kiah Mok Goh, Hian-Leng Chan, Teck-Yian Lim, Keck Voon Ling:
Towards machine diagnostics on chip. ICARCV 2010: 1353-1358 - 2008
- [c1]Sheng Huang, Dan Hong Zhang, Wai Yie Leong, Hian-Leng Chan, Kiah Mok Goh, Jing-Bing Zhang, Kristo:
Detecting tool breakage using accelerometer in ball-nose end milling. ICARCV 2008: 927-933
Informal and Other Publications
- 2018
- [i1]Chong Zhang, Geok Soon Hong, Jun-Hong Zhou, Kay Chen Tan, Haizhou Li, Huan Xu, Jihoon Hong, Hian-Leng Chan:
A Multi-State Diagnosis and Prognosis Framework with Feature Learning for Tool Condition Monitoring. CoRR abs/1805.00367 (2018)
Coauthor Index
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