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Sang Kyun Nam

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2010 – 2019

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2017
[j1]
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  - journals/dt/JunNJLPL17
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  - https://dblp.org/rec/journals/dt/JunNJLPL17
Hongshin Jun, Sang Kyun Nam, Han Ho Jin, Jong-Chern Lee, Yong Jae Park, Jaejin Lee:
High-Bandwidth Memory (HBM) Test Challenges and Solutions. IEEE Des. Test 34(1): 16-25 (2017)
2014
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Dong-Uk Lee, Kyung Whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin-Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sung-Joo Hong:
An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. VLSIC 2014: 1-2

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