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Rainer Duschl

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Journal Articles

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2017
[j4]
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  - journals/mr/DuschlFGW17
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Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner:
Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. Microelectron. Reliab. 76-77: 149-153 (2017)
2007
[j3]
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Rainer Duschl, Martin Kerber, A. Avellan, S. Jakschik, Uwe Schroeder, S. Kudelka:
Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. Microelectron. Reliab. 47(4-5): 497-500 (2007)
2005
[j2]
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  - journals/mr/NeumannTD05
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Gerald Neumann, J. Touzel, Rainer Duschl:
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. Microelectron. Reliab. 45(9-11): 1520-1525 (2005)
[j1]
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Rainer Duschl, Rolf-Peter Vollertsen:
Is the power-law model applicable beyond the direct tunneling regime? Microelectron. Reliab. 45(12): 1861-1867 (2005)

Conference and Workshop Papers

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2001
[c1]
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  - conf/ismvl/ProstATPGDES01
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Werner Prost, Uwe Auer, Franz-Josef Tegude, Christian Pacha, Karl Goser, Rainer Duschl, K. Eberl, O. Schmidt:
Tunnelling Diode Technology. ISMVL 2001: 49-60

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