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M. Zahir

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2015
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A. Bensoussan, Ephraim Suhir, P. Henderson, M. Zahir:
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation. Microelectron. Reliab. 55(9-10): 1729-1735 (2015)

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