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N. Rouag

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2010 – 2019

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2018
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T. H. Nouibat, Zitouni Messai, D. Chikouch, Zahir Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey:
Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectron. Reliab. 91: 183-187 (2018)
2015
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N. Rouag, Zahir Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey:
Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectron. Reliab. 55(7): 1028-1034 (2015)

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