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Béatrice Vanhuffel

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2010 – 2019

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2015
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  - journals/mr/GoxeAV15
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  - https://dblp.org/rec/journals/mr/GoxeAV15
Julien Goxe, C. Abouda, Béatrice Vanhuffel:
Latent gate oxide defects case studies. Microelectron. Reliab. 55(9-10): 1607-1610 (2015)
2014
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Yann Weber, Linda Buffo, Béatrice Vanhuffel, Nicholas Lee, Neal Stirlen, Jeff Chen, Xiang-Dong Wang:
Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect. Microelectron. Reliab. 54(9-10): 2064-2069 (2014)

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