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W. T. Saw

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2004
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C. K. Chen, W. A. Tan, H. S. Goh, Y. S. Yip, W. T. Saw:
Full ball shear metrology as defect detection and analysis tool for solder joint reliability assessment on direct immersion gold technology. Microelectron. Reliab. 44(9-11): 1281-1285 (2004)

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