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Fatima Adly

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2010 – 2019

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2015
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  - journals/tii/AdlyAYATMJLI15
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  - https://dblp.org/rec/journals/tii/AdlyAYATMJLI15
Fatima Adly, Omar Alhussein, Paul D. Yoo, Yousof Al-Hammadi, Kamal Taha, Sami Muhaidat, Young-Seon Jeong, Uihyoung Lee, Mohammed Ismail:
Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps. IEEE Trans. Ind. Informatics 11(6): 1267-1276 (2015)
2014
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Fatima Adly, Paul D. Yoo, Sami Muhaidat, Yousof Al-Hammadi:
Machine-Learning-Based Identification of Defect Patterns in Semiconductor Wafer Maps: An Overview and Proposal. IPDPS Workshops 2014: 420-429

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