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Tuami Lasri
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2010 – 2019
- 2016
- [j9]Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri:
Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. IEEE Trans. Instrum. Meas. 65(4): 890-897 (2016) - 2015
- [c8]Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Gilles Dambrine, Tuami Lasri:
Measurement accuracy and repeatability in near-field scanning microwave microscopy. I2MTC 2015: 1735-1740 - [c7]Abdelhatif El Fellahi, Kamel Haddadi, Jaouad Marzouk, Steve Arscott, Christophe Boyaval, Tuami Lasri, Gilles Dambrine:
On-wafer probe station for microwave metrology at the nanoscale. I2MTC 2015: 1960-1964 - [c6]Kamel Haddadi, Tuami Lasri:
Forward V-band vector network analyzer based on a modified six-port technique. WiSNet 2015: 23-25 - 2014
- [j8]Hind Bakli, Kamel Haddadi, Tuami Lasri:
Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications. IEEE Trans. Instrum. Meas. 63(5): 1281-1286 (2014) - [j7]Kamel Haddadi, Tuami Lasri:
Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement. IEEE Trans. Instrum. Meas. 63(7): 1818-1823 (2014) - [c5]Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria:
1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer. NEWCAS 2014: 385-388 - [c4]Kamel Haddadi, Tuami Lasri:
Six-port technology for millimeter-wave radar and imaging applications. WiSNet 2014: 1-3 - 2013
- [j6]Kamel Haddadi, Tuami Lasri:
Scanning Microwave Near-Field Microscope Based on the Multiport Technology. IEEE Trans. Instrum. Meas. 62(12): 3189-3193 (2013) - [c3]Hind Bakli, Kamel Haddadi, Tuami Lasri:
Interferometric technique for scanning near-field microwave microscopy applications. I2MTC 2013: 1694-1698 - 2012
- [j5]Etienne Herth, H. Desré, Emmanuelle Algré, Christiane Legrand, Tuami Lasri:
Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications. Microelectron. Reliab. 52(1): 141-146 (2012) - 2011
- [j4]Kamel Haddadi, M. M. Wang, David Glay, Tuami Lasri:
Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer. IEEE Trans. Instrum. Meas. 60(9): 3207-3213 (2011) - 2010
- [j3]Etienne Herth, Bernard Legrand, Lionel Buchaillot, Nathalie Rolland, Tuami Lasri:
Optimization of SiNX: H films deposited by PECVD for reliability of electronic, microsystems and optical applications. Microelectron. Reliab. 50(8): 1103-1106 (2010)
2000 – 2009
- 2008
- [j2]O. Benzaim, Kamel Haddadi, M. M. Wang, M. Maazi, David Glay, Tuami Lasri:
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique. IEEE Trans. Instrum. Meas. 57(11): 2392-2397 (2008) - [j1]M. Maazi, O. Benzaim, David Glay, Tuami Lasri:
Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks. IEEE Trans. Instrum. Meas. 57(12): 2819-2826 (2008) - 2006
- [c2]Kamel Haddadi, Hassan El Aabbaoui, Christophe Loyez, David Glay, Nathalie Rolland, Tuami Lasri:
Wide-band 0.9 GHz to 4 GHz Four-Port Receiver. ICECS 2006: 1316-1319 - [c1]Kamel Haddadi, David Glay, Tuami Lasri:
Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements. ISCAS 2006
Coauthor Index
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