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S. A. K. Gharavi

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2013
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Behzad Eghbalkhah, S. A. K. Gharavi, Ali Afzali-Kusha, M. B. Ghaznavi-Ghoushchi:
Self-impact of NBTI effect on the degradation rate of threshold voltage in PMOS transistors. DTIS 2013: 151-154

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