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Christopher Henard
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2010 – 2019
- 2017
- [c14]Thomas Laurent, Mike Papadakis, Marinos Kintis, Christopher Henard, Yves Le Traon, Anthony Ventresque:
Assessing and Improving the Mutation Testing Practice of PIT. ICST 2017: 430-435 - 2016
- [c13]Christopher Henard, Mike Papadakis, Mark Harman, Yue Jia, Yves Le Traon:
Comparing white-box and black-box test prioritization. ICSE 2016: 523-534 - [c12]Mike Papadakis, Christopher Henard, Mark Harman, Yue Jia, Yves Le Traon:
Threats to the validity of mutation-based test assessment. ISSTA 2016: 354-365 - [c11]Henry Coles, Thomas Laurent, Christopher Henard, Mike Papadakis, Anthony Ventresque:
PIT: a practical mutation testing tool for Java (demo). ISSTA 2016: 449-452 - [i2]Thomas Laurent, Anthony Ventresque, Mike Papadakis, Christopher Henard, Yves Le Traon:
Assessing and Improving the Mutation Testing Practice of PIT. CoRR abs/1601.02351 (2016) - 2015
- [b1]Christopher Henard:
Enabling Testing of Large Scale Highly Configurable Systems with Search-based Software Engineering: the Case of Model-based Software Product Lines. University of Luxembourg, 2015 - [j2]Antonia Bertolino, Said Daoudagh, Donia El Kateb, Christopher Henard, Yves Le Traon, Francesca Lonetti, Eda Marchetti, Tejeddine Mouelhi, Mike Papadakis:
Similarity testing for access control. Inf. Softw. Technol. 58: 355-372 (2015) - [c10]Christopher Henard, Mike Papadakis, Mark Harman, Yves Le Traon:
Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines. ICSE (1) 2015: 517-528 - [c9]Christopher Henard, Mike Papadakis, Yves Le Traon:
Flattening or not of the combinatorial interaction testing models? ICST Workshops 2015: 1-4 - 2014
- [j1]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon:
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines. IEEE Trans. Software Eng. 40(7): 650-670 (2014) - [c8]Mike Papadakis, Christopher Henard, Yves Le Traon:
Sampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing. ICST 2014: 1-10 - [c7]Christopher Henard, Mike Papadakis, Yves Le Traon:
MutaLog: A Tool for Mutating Logic Formulas. ICST Workshops 2014: 399-404 - [c6]Tewfik Ziadi, Christopher Henard, Mike Papadakis, Mikal Ziane, Yves Le Traon:
Towards a language-independent approach for reverse-engineering of software product lines. SAC 2014: 1064-1071 - [c5]Christopher Henard, Mike Papadakis, Yves Le Traon:
Mutation-Based Generation of Software Product Line Test Configurations. SSBSE 2014: 92-106 - 2013
- [c4]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Towards automated testing and fixing of re-engineered feature models. ICSE 2013: 1245-1248 - [c3]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. ICST Workshops 2013: 188-197 - [c2]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Multi-objective test generation for software product lines. SPLC 2013: 62-71 - [c1]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
PLEDGE: a product line editor and test generation tool. SPLC Workshops 2013: 126-129 - 2012
- [i1]Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon:
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines. CoRR abs/1211.5451 (2012)
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