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A. Kabakow

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2005
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Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit:
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectron. Reliab. 45(9-11): 1544-1549 (2005)
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Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner:
Impact of back side circuit edit on active device performance in bulk silicon ICs. ITC 2005: 9

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