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A. Bouzourene

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Journal Articles

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2013
[j2]
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  - journals/mr/OthmanLBKIB13
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  - https://dblp.org/rec/journals/mr/OthmanLBKIB13
D. Othman, Stéphane Lefebvre, Mounira Berkani, Zoubir Khatir, Ali Ibrahim, A. Bouzourene:
Robustness of 1.2 kV SiC MOSFET devices. Microelectron. Reliab. 53(9-11): 1735-1738 (2013)
2012
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D. Othman, M. Bouarroudj-Berkani, Stéphane Lefebvre, Ali Ibrahim, Zoubir Khatir, A. Bouzourene:
Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. Microelectron. Reliab. 52(9-10): 1859-1864 (2012)

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