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Journal Articles
- 2021
- [j14]Nakwon Lee, Yunho Kim, Moonzoo Kim, Duksan Ryu, Jongmoon Baik:
Directed Model Checking for Fast Abstract Reachability Analysis. IEEE Access 9: 158738-158750 (2021) - 2020
- [j13]Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim:
MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry. Inf. Softw. Technol. 123: 106221 (2020) - 2019
- [j12]Yunho Kim, Seokhyeon Mun, Shin Yoo, Moonzoo Kim:
Precise Learn-to-Rank Fault Localization Using Dynamic and Static Features of Target Programs. ACM Trans. Softw. Eng. Methodol. 28(4): 23:1-23:34 (2019) - 2017
- [j11]Shin Hong, Taehoon Kwak, Byeongcheol Lee, Yiru Jeon, Bongseok Ko, Yunho Kim, Moonzoo Kim:
MUSEUM: Debugging real-world multilingual programs using mutation analysis. Inf. Softw. Technol. 82: 80-95 (2017) - 2015
- [j10]Zhihong Xu, Yunho Kim, Moonzoo Kim, Myra B. Cohen, Gregg Rothermel:
Directed test suite augmentation: an empirical investigation. Softw. Test. Verification Reliab. 25(2): 77-114 (2015) - [j9]Shin Hong, Moonzoo Kim:
A survey of race bug detection techniques for multithreaded programmes. Softw. Test. Verification Reliab. 25(3): 191-217 (2015) - [j8]Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. Softw. Test. Verification Reliab. 25(4): 334-370 (2015) - 2013
- [j7]Shin Hong, Moonzoo Kim:
Effective pattern-driven concurrency bug detection for operating systems. J. Syst. Softw. 86(2): 377-388 (2013) - [j6]Young Joo Kim, Okjoo Choi, Moonzoo Kim, Jongmoon Baik, Tai-Hyo Kim:
Validating Software Reliability Early through Statistical Model Checking. IEEE Softw. 30(3): 35-41 (2013) - 2012
- [j5]Moonzoo Kim, Yunho Kim, Yunja Choi:
Concolic testing of the multi-sector read operation for flash storage platform software. Formal Aspects Comput. 24(3): 355-374 (2012) - [j4]Yunja Choi, Moonzoo Kim:
Controlled composition and abstraction for bottom-up integration and verification of abstract components. Inf. Softw. Technol. 54(1): 119-136 (2012) - 2011
- [j3]Moonzoo Kim, Yunho Kim, Hotae Kim:
A Comparative Study of Software Model Checkers as Unit Testing Tools: An Industrial Case Study. IEEE Trans. Software Eng. 37(2): 146-160 (2011) - 2007
- [j2]Joel M. Esposito, Moonzoo Kim:
Using Formal Modeling With an Automated Analysis Tool to Design and Parametrically Analyze a Multirobot Coordination Protocol: A Case Study. IEEE Trans. Syst. Man Cybern. Part A 37(3): 285-297 (2007) - 2004
- [j1]Moonzoo Kim, Mahesh Viswanathan, Sampath Kannan, Insup Lee, Oleg Sokolsky:
Java-MaC: A Run-Time Assurance Approach for Java Programs. Formal Methods Syst. Des. 24(2): 129-155 (2004)
Conference and Workshop Papers
- 2022
- [c42]Ahcheong Lee, Irfan Ariq, Yunho Kim, Moonzoo Kim:
POWER: Program Option-Aware Fuzzer for High Bug Detection Ability. ICST 2022: 220-231 - [c41]Robert Sebastian Herlim, Yunho Kim, Moonzoo Kim:
CITRUS: Automated Unit Testing Tool for Real-world C++ Programs. ICST 2022: 400-410 - 2021
- [c40]Robert Sebastian Herlim, Shin Hong, Yunho Kim, Moonzoo Kim:
Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark. SSBSE 2021: 121-135 - 2019
- [c39]Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim:
Concolic testing for high test coverage and reduced human effort in automotive industry. ICSE (SEIP) 2019: 151-160 - [c38]Sampath Kannan, Moonzoo Kim, Insup Lee, Oleg Sokolsky, Mahesh Viswanathan:
A Retrospective Look at the Monitoring and Checking (MaC) Framework. RV 2019: 1-14 - [c37]Yunho Kim, Shin Hong, Moonzoo Kim:
Target-driven compositional concolic testing with function summary refinement for effective bug detection. ESEC/SIGSOFT FSE 2019: 16-26 - 2018
- [c36]Yunho Kim, Yunja Choi, Moonzoo Kim:
Precise concolic unit testing of C programs using extended units and symbolic alarm filtering. ICSE 2018: 315-326 - [c35]Duy Loc Phan, Yunho Kim, Moonzoo Kim:
MUSIC: Mutation Analysis Tool with High Configurability and Extensibility. ICST Workshops 2018: 40-46 - [c34]Yunho Kim, Shin Hong, Bongseok Ko, Duy Loc Phan, Moonzoo Kim:
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage. ICST 2018: 239-249 - 2015
- [c33]Yongbae Park, Shin Hong, Moonzoo Kim, Dongju Lee, Junhee Cho:
Systematic Testing of Reactive Software with Non-Deterministic Events: A Case Study on LG Electric Oven. ICSE (2) 2015: 29-38 - [c32]Shin Hong, Byeongcheol Lee, Taehoon Kwak, Yiru Jeon, Bongsuk Ko, Yunho Kim, Moonzoo Kim:
Mutation-Based Fault Localization for Real-World Multilingual Programs (T). ASE 2015: 464-475 - 2014
- [c31]Yunho Kim, Moonzoo Kim:
SAT-Based Bounded Software Model Checking for Embedded Software: A Case Study. APSEC (1) 2014: 55-62 - [c30]Shin Hong, Yongbae Park, Moonzoo Kim:
Detecting Concurrency Errors in Client-Side Java Script Web Applications. ICST 2014: 61-70 - [c29]Seokhyeon Moon, Yunho Kim, Moonzoo Kim, Shin Yoo:
Ask the Mutants: Mutating Faulty Programs for Fault Localization. ICST 2014: 153-162 - [c28]Yunho Kim, Zhihong Xu, Moonzoo Kim, Myra B. Cohen, Gregg Rothermel:
Hybrid Directed Test Suite Augmentation: An Interleaving Framework. ICST 2014: 263-272 - 2013
- [c27]Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
The Impact of Concurrent Coverage Metrics on Testing Effectiveness. ICST 2013: 232-241 - [c26]Yunho Kim, Youil Kim, Taeksu Kim, Gunwoo Lee, Yoonkyu Jang, Moonzoo Kim:
Automated unit testing of large industrial embedded software using concolic testing. ASE 2013: 519-528 - 2012
- [c25]Young Joo Kim, Moonzoo Kim, Tai-Hyo Kim:
Statistical Model Checking for Safety Critical Hybrid Systems: An Empirical Evaluation. Haifa Verification Conference 2012: 162-177 - [c24]Yunho Kim, Moonzoo Kim, Young Joo Kim, Yoonkyu Jang:
Industrial application of concolic testing approach: A case study on libexif by using CREST-BV and KLEE. ICSE 2012: 1143-1152 - [c23]Moonzoo Kim, Yunho Kim, Gregg Rothermel:
A Scalable Distributed Concolic Testing Approach: An Empirical Evaluation. ICST 2012: 340-349 - [c22]Moonzoo Kim, Yunho Kim, Yoonkyu Jang:
Industrial Application of Concolic Testing on Embedded Software: Case Studies. ICST 2012: 390-399 - [c21]Young Joo Kim, Moonzoo Kim:
Hybrid Statistical Model Checking Technique for Reliable Safety Critical Systems. ISSRE 2012: 51-60 - [c20]Matt Staats, Shin Hong, Moonzoo Kim, Gregg Rothermel:
Understanding user understanding: determining correctness of generated program invariants. ISSTA 2012: 188-198 - [c19]Shin Hong, Jaemin Ahn, Sangmin Park, Moonzoo Kim, Mary Jean Harrold:
Testing concurrent programs to achieve high synchronization coverage. ISSTA 2012: 210-220 - 2011
- [c18]Moonzoo Kim, Yunho Kim:
Automated Analysis of Industrial Embedded Software. ATVA 2011: 51-59 - [c17]Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rothermel:
A Hybrid Directed Test Suite Augmentation Technique. ISSRE 2011: 150-159 - [c16]Yunho Kim, Moonzoo Kim:
SCORE: a scalable concolic testing tool for reliable embedded software. SIGSOFT FSE 2011: 420-423 - 2010
- [c15]Yunho Kim, Moonzoo Kim, Nam Dang:
Scalable Distributed Concolic Testing: A Case Study on a Flash Storage Platform. ICTAC 2010: 199-213 - [c14]Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rothermel, Myra B. Cohen:
Directed test suite augmentation: techniques and tradeoffs. SIGSOFT FSE 2010: 257-266 - 2009
- [c13]Moonzoo Kim, Yunho Kim:
Concolic Testing of the Multi-sector Read Operation for Flash Memory File System. SBMF 2009: 251-265 - [c12]Moonzoo Kim, Shin Hong, Changki Hong, Taeho Kim:
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay. MBT@ETAPS 2009: 21-36 - 2008
- [c11]Moonzoo Kim, Yunja Choi, Yunho Kim, Hotae Kim:
Pre-testing Flash Device Driver through Model Checking Techniques. ICST 2008: 475-484 - [c10]Moonzoo Kim, Yunho Kim, Hotae Kim:
Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker. ASE 2008: 198-207 - [c9]Moonzoo Kim, Yunja Choi, Yunho Kim, Hotae Kim:
Formal Verification of a Flash Memory Device Driver - An Experience Report. SPIN 2008: 144-159 - 2007
- [c8]Moonzoo Kim:
Formal Modeling and Verification of High-Availability Protocol for Network Security Appliances. ATVA 2007: 489-500 - 2006
- [c7]Kyo Chul Kang, Jaejoon Lee, Byungkil Kim, Moonzoo Kim, Chang-woo Seo, Seung-lyeol Yu:
Re-engineering a Credit Card Authorization System for Maintainability and Reusability of Components - A Case Study. ICSR 2006: 156-169 - 2005
- [c6]Moonzoo Kim, Kyo Chul Kang:
Formal Construction and Verification of Home Service Robots: A Case Study. ATVA 2005: 429-443 - [c5]Kyo Chul Kang, Moonzoo Kim, Jaejoon Lee, Byungkil Kim, Youngjin Hong, Hyoungki Lee, Seokwon Bang:
3D Virtual Prototyping of Home Service Robots Using ASADAL/OBJ. ICRA 2005: 2903-2908 - [c4]Moonzoo Kim, Kyo Chul Kang, Hyoungki Lee:
Formal Verification of Robot Movements - a Case Study on Home Service Robot SHR100. ICRA 2005: 4739-4744 - [c3]Moonzoo Kim, Jaejoon Lee, Kyo Chul Kang, Youngjin Hong, Seokwon Bang:
Re-engineering software architecture of home service robots: a case study. ICSE 2005: 505-513 - [c2]Kyo Chul Kang, Moonzoo Kim, Jaejoon Lee, Byungkil Kim:
Feature-Oriented Re-engineering of Legacy Systems into Product Line Assets - a Case Study. SPLC 2005: 45-56 - 2004
- [c1]Mahesh Viswanathan, Moonzoo Kim:
Foundations for the Run-Time Monitoring of Reactive Systems - Fundamentals of the MaC Language. ICTAC 2004: 543-556
Editorship
- 2008
- [e1]Sung Deok Cha, Jin-Young Choi, Moonzoo Kim, Insup Lee, Mahesh Viswanathan:
Automated Technology for Verification and Analysis, 6th International Symposium, ATVA 2008, Seoul, Korea, October 20-23, 2008. Proceedings. Lecture Notes in Computer Science 5311, Springer 2008, ISBN 978-3-540-88386-9 [contents]
Coauthor Index
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