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2020 – today
- 2024
[i1]Jian Cui, Hanna Kim, Eugene Jang, Dayeon Yim, Kicheol Kim, Yongjae Lee, Jin-Woo Chung, Seungwon Shin, Xiaojing Liao:
Tweezers: A Framework for Security Event Detection via Event Attribution-centric Tweet Embedding. CoRR abs/2409.08221 (2024)- 2022
- [c3]Kicheol Kim, Misoo Kim
, Eunseok Lee:
Systematic Analysis of Defect-Specific Code Abstraction for Neural Program Repair. APSEC 2022: 81-89 - [c2]Misoo Kim, Youngkyoung Kim, Kicheol Kim, Eunseok Lee:
Multi-objective Optimization-based Bug-fixing Template Mining for Automated Program Repair. ASE 2022: 179:1-179:5
2000 – 2009
- 2008
- [j6]Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Trans. Electron. 91-C(4): 670-672 (2008) - [j5]Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang:
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Trans. Inf. Syst. 91-D(4): 1185-1188 (2008) - [j4]Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang:
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Trans. Electron. 91-C(10): 1713-1716 (2008) - 2007
- [j3]Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang:
A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Trans. Electron. 90-C(11): 2161-2163 (2007) - 2006
- [c1]Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang:
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. ATS 2006: 17-24 - 2005
- [j2]Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang:
A New Low Power Test Pattern Generator for BIST Architecture. IEICE Trans. Electron. 88-C(10): 2037-2038 (2005) - 2004
- [j1]Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang:
Code-width testing-based compact ADC BIST circuit. IEEE Trans. Circuits Syst. II Express Briefs 51-II(11): 603-606 (2004)
Coauthor Index
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