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Journal Articles
- 2012
[j12]Thomas E. Lipe, Joseph R. Kinard:
Quantum AC Voltage Standards. IEEE Trans. Instrum. Meas. 61(8): 2160-2166 (2012)- 2009
- [j11]Samuel P. Benz, Paul D. Dresselhaus, Alain Rüfenacht, Norman F. Bergren, Joseph R. Kinard, Regis Pinheiro Landim:
Progress Toward a 1 V Pulse-Driven AC Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 838-843 (2009) - [j10]Piotr S. Filipski, Joseph R. Kinard, Thomas E. Lipe, Yi-Hua Tang, Samuel P. Benz:
Correction of Systematic Errors Due to the Voltage Leads in an AC Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 853-858 (2009) - [j9]Luciana Scarioni, Thomas E. Lipe, Joseph R. Kinard:
Design and Fabrication of MJTCs on Quartz Substrates at NIST. IEEE Trans. Instrum. Meas. 58(4): 868-871 (2009) - 2007
- [j8]Samuel P. Benz, Charles J. Burroughs Jr., Paul D. Dresselhaus, Norman F. Bergren, Thomas E. Lipe, Joseph R. Kinard, Yi-Hua Tang:
An AC Josephson Voltage Standard for AC-DC Transfer-Standard Measurements. IEEE Trans. Instrum. Meas. 56(2): 239-243 (2007) - [j7]George M. Free, Thomas E. Lipe, Joseph R. Kinard, June E. Sims:
Characterization of RF-DC Transfer Difference for Thermal Voltage Converters With Built-in Tees in the Frequency Range 1 MHz to 1 GHz. IEEE Trans. Instrum. Meas. 56(2): 341-345 (2007) - 2005
- [j6]Héctor Laiz, Thomas F. Wunsch, Joseph R. Kinard, Thomas E. Lipe:
1-A and-120 mA thin-film multijunction thermal converters. IEEE Trans. Instrum. Meas. 54(2): 803-806 (2005) - 2002
- [j5]Joseph R. Kinard, Thomas E. Lipe, Svetlana Avramov-Zamurovic:
A new binary inductive divider comparator system for measuring high-voltage thermal converters. IEEE Trans. Instrum. Meas. 51(5): 1045-1049 (2002) - 2001
- [j4]Thomas E. Lipe, Joseph R. Kinard, Carl D. Reintsema:
Improvements in the NIST cryogenic thermal transfer standard. IEEE Trans. Instrum. Meas. 50(2): 326-329 (2001) - [j3]Thomas F. Wunsch, Joseph R. Kinard, Ronald P. Manginell, Otis M. Solomon Jr., Thomas E. Lipe, Kenneth Corneal Jungling:
A new fabrication process for planar thin-film multijunction thermal converters. IEEE Trans. Instrum. Meas. 50(2): 330-332 (2001) - [j2]Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip:
Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE Trans. Instrum. Meas. 50(2): 349-352 (2001) - 1999
- [j1]Charles J. Burroughs Jr., Samuel P. Benz, Clark A. Hamilton, Todd E. Harvey, Joseph R. Kinard, Thomas E. Lipe, Hitoshi Sasaki:
Thermoelectric transfer difference of thermal converters measured with a Josephson source. IEEE Trans. Instrum. Meas. 48(2): 282-284 (1999)
Coauthor Index
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