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Todd P. Kelsey

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1990 – 1999

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1993
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Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee:
An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42(11): 1361-1371 (1993)

1980 – 1989

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1989
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Todd P. Kelsey, Kewal K. Saluja:
Fast test generation for sequential circuits. ICCAD 1989: 345-347

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