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Gary C. Moyer

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Journal Articles

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1997
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Gary C. Moyer, Mark Clements, Wentai Liu, Toby Schaffer, Ralph K. Cavin III:
The delay vernier pattern generation technique. IEEE J. Solid State Circuits 32(4): 551-562 (1997)

Conference and Workshop Papers

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1995
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Gary C. Moyer, Mark Clements, Wentai Liu, Toby Schaffer, Ralph K. Cavin III:
A technique for high-speed, fine-resolution pattern generation and its CMOS implementation. ARVLSI 1995: 131-149
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Gary C. Moyer, Mark Clements, Wentai Liu, Toby Schaffer, Ralph K. Cavin III:
High Speed, Fine Resolution Pattern Generation Using the Matched Delay Technique. ISCAS 1995: 405-408

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