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Cees W. J. Oomens

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2005
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Radj A. Baldewsing, Johannes A. Schaar, Frits Mastik, Cees W. J. Oomens, Anton F. W. van der Steen:
Assessment of vulnerable plaque composition by matching the deformation of a parametric plaque model to measured plaque deformation. IEEE Trans. Medical Imaging 24(4): 514-528 (2005)

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