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Journal Articles
- 2024
[j9]Weiwei Mao
, Teng Pang, Zhirong Guo, Hongbao Bai, Zhixiong Huang, Xiaoyu Jin:
Analysis of the Research Progress of Electromagnetic Railgun Based on CiteSpace. IEEE Access 12: 3499-3513 (2024)- [j8]Weiwei Mao, Suping Yu, Wenqing Chen:
Short-Term Power Load Forecasting Method Based on GRU-Transformer Combined Neural Network Model. J. Comput. Inf. Technol. 32(1): 1-14 (2024) - 2022
- [j7]Zhuheng Lu, Weiwei Mao, Yuewei Dai, Weiqing Li, Zhiyong Su:
Slicing-Tracking-Detection: Simultaneous Multi-Cylinder Detection From Large-Scale and Complex Point Clouds. IEEE Trans. Vis. Comput. Graph. 28(12): 4172-4185 (2022) - 2020
- [j6]Weiwei Mao, Zhuheng Lu, Yuewei Dai, Weiqing Li, Zhiyong Su:
Partial Matching of Large Scale Process Plant Models Using Random Walk on Graphs. IEEE Access 8: 201109-201119 (2020) - 2019
- [j5]Bo Zhang, Jinhang Zuo, Weiwei Mao:
SmartWAZ: Design and Implementation of a Smart WiFi Access System Assisted by Zigbee. IEEE Access 7: 31002-31009 (2019) - 1994
- [j4]Weiwei Mao, Michael D. Ciletti:
Reducing correlation to improve coverage of delay faults in scan-path design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(5): 638-646 (1994) - 1992
- [j3]Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao:
IDDQ testing: A review. J. Electron. Test. 3(4): 291-303 (1992) - [j2]Weiwei Mao, Ravi K. Gulati:
Quietest: A methodology for selecting IDDQ test vectors. J. Electron. Test. 3(4): 349-357 (1992) - 1990
- [j1]Weiwei Mao, Michael D. Ciletti:
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(8): 893-898 (1990)
Conference and Workshop Papers
- 2013
- [c13]Chao Wang, Weiwei Mao, Xiaobo Li, Weisheng Chen, Jing Li:
Quantized-data consensus of second-order multi-agent systems with directed topology. ASCC 2013: 1-6 - 1996
- [c12]Weiwei Mao, Ravi K. Gulati:
Improving Gate Level Fault Coverage by RTL Fault Grading. ITC 1996: 150-159 - 1994
- [c11]Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati:
Structure and Metrology for a Single-wire Analog. ITC 1994: 919-928 - 1992
- [c10]Weiwei Mao, Michael D. Ciletti:
A quantitative measure of robustness for delay fault testing. EURO-DAC 1992: 543-549 - [c9]Weiwei Mao, Michael D. Ciletti:
Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. ITC 1992: 588-597 - [c8]Ravi K. Gulati, Weiwei Mao, Deepak K. Goel:
Detection of "Undetectable" Faults Using IDDQ Testing. ITC 1992: 770-777 - 1991
- [c7]Weiwei Mao, Michael D. Ciletti:
Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage. DAC 1991: 73-79 - 1990
- [c6]Weiwei Mao, Michael D. Ciletti:
A Variable Observation Time Method for Testing Delay Faults. DAC 1990: 728-731 - [c5]Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti:
QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. ICCAD 1990: 280-283 - [c4]Weiwei Mao, Michael D. Ciletti:
Arrangement of latches in scan-path design to improve delay fault coverage. ITC 1990: 387-393 - 1989
- [c3]Weiwei Mao, Michael D. Ciletti:
A Simplified Six-waveform Type Method for Delay Fault Testing. DAC 1989: 730-733 - 1988
- [c2]Weiwei Mao, Michael D. Ciletti:
Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation. DAC 1988: 591-596 - 1986
- [c1]Weiwei Mao, Xieting Ling:
Robust test generation algorithm for stuck-open fault in CMOS circuits. DAC 1986: 236-242
Coauthor Index
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