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Y. F. En

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2018
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Zhifeng Lei, H. X. Guo, M. H. Tang, C. Zeng, Zhangang Zhang, H. Chen, Y. F. En, Y. Huang, Yiqiang Chen, Chao Peng:
Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation. Microelectron. Reliab. 80: 312-316 (2018)

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