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Y. Bilenko

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2010 – 2019

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2010
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Matteo Meneghini, Diego Barbisan, Y. Bilenko, Maxim S. Shatalov, J. Yang, R. Gaska, Gaudenzio Meneghesso, Enrico Zanoni:
Defect-related degradation of Deep-UV-LEDs. Microelectron. Reliab. 50(9-11): 1538-1542 (2010)

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