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ORCIDErkan Acar
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2010 – 2019
- 2010
[j4]Erkan Acar, Sule Ozev:
Low Cost MIMO Testing for RF Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(9): 1348-1356 (2010)- [c14]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect filter for alternate RF test. ETS 2010: 265-270
2000 – 2009
- 2009
- [j3]Erkan Acar, Sule Ozev:
Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(7): 993-1005 (2009) - [c13]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect Filter for Alternate RF Test. ETS 2009: 101-106 - [c12]Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar:
Built-in EVM measurement for OFDM transceivers using all-digital DFT. ITC 2009: 1-10 - 2008
- [j2]Erkan Acar, Sule Ozev:
Defect-Oriented Testing of RF Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5): 920-931 (2008) - [c11]Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler:
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10 - 2007
- [j1]Erkan Acar, Sule Ozev:
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. IEEE Trans. Very Large Scale Integr. Syst. 15(1): 37-47 (2007) - [c10]Erkan Acar, Sule Ozev:
Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. ICCD 2007: 512-517 - [c9]Erkan Acar, Sule Ozev:
Low cost characterization of RF transceivers through IQ data analysis. ITC 2007: 1-10 - [c8]Fang Liu, Erkan Acar, Sule Ozev:
Test yield estimation for analog/RF circuits over multiple correlated measurements. ITC 2007: 1-10 - [c7]Erkan Acar, Sule Ozev, Kevin B. Redmond:
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. VTS 2007: 3-8 - 2006
- [c6]Erkan Acar, Sule Ozev, Kevin B. Redmond:
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. ICCAD 2006: 210-216 - [c5]Erkan Acar, Sule Ozev:
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. ICCD 2006: 432-437 - 2005
- [c4]Erkan Acar, Sule Ozev:
Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. ICCAD 2005: 73-79 - [c3]Erkan Acar, Sule Ozev:
Defect-based RF testing using a new catastrophic fault model. ITC 2005: 9 - [c2]Erkan Acar, Sule Ozev:
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. VTS 2005: 374-379 - 2004
- [c1]Erkan Acar, Sule Ozev:
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792
Coauthor Index
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