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Microelectronics Journal, Volume 124

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Volume 124, June 2022

Regular Papers

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  - journals/mj/ShivakumarSY22
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Vishnupriya Shivakumar, Chinnaiyan Senthilpari, Zubaida Binti Yusoff:
Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs. 105430
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  - journals/mj/HuangLLRZL22
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Sichong Huang, Tiejun Lu, Zhenlin Lu, Jinye Rong, Xuan Zhao, Jing Li:
CMOS image sensor fixed pattern noise calibration scheme based on digital filtering method. 105431
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  - journals/mj/ArunSJ22
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A. V. Arun, P. S. Sreelekshmi, Jobymol Jacob:
Design and analysis of dopingless 1T DRAM using work function engineered tunnel field effect transistors. 105433
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  - journals/mj/LinZFZW22
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Ye Lin, Yuejun Zhang, Shengjie Fu, Huihong Zhang, Pengjun Wang:
A configurable detection chip with ±0.6% Inaccuracy for liquid conductivity using dual-frequency sinusoidal signal technique in 65 nm CMOS. 105434
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Hao Li, Ang Hu, Zheng Nie, Dongsheng Liu, Guangda Niu, Liang Gao, Jiang Tang:
A 640×512 ROIC with optimized BDI input stage and low power output buffer for CQDs-based infrared image sensor. 105435
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  - journals/mj/PandeyK22
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Priyanka Pandey, Harsupreet Kaur:
Performance investigation of Reconfigurable-FET under the influence of parameter variability of ferroelectric gate stack at high temperatures. 105442
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  - journals/mj/WangLWYYHL22
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Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu:
A reconfigurable PUF structure with dual working modes based on entropy separation model. 105445

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