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Computers in Industry, Volume 152

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Volume 152, November 2023

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Dejene M. Sime, Guotai Wang, Zhi Zeng, Bei Peng:
Uncertainty-aware and dynamically-mixed pseudo-labels for semi-supervised defect segmentation. 103995
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  - journals/cii/LupiMBFAMLL23
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Francesco Lupi, Mohammed M. Mabkhot, Eleonora Boffa, Pedro Ferreira, Dario Antonelli, Antonio Maffei, Niels Lohse, Michele Lanzetta:
Automatic definition of engineer archetypes: A text mining approach. 103996
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  - journals/cii/LeeKCBPOK23
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Dong-Hee Lee, Eun-Su Kim, Seung-Hyun Choi, Young-Mok Bae, Jong-Bum Park, Young-Chan Oh, Kwang-Jae Kim:
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods. 104005
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  - journals/cii/MakandaJYS23
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Inno Lorren Désir Makanda, Pingyu Jiang, Maolin Yang, Haoliang Shi:
Emergence of collective intelligence in industrial cyber-physical-social systems for collaborative task allocation and defect detection. 104006
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Julia Robles, Cristian Martín, Manuel Díaz:
OpenTwins: An open-source framework for the development of next-gen compositional digital twins. 104007
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  - journals/cii/CaggianoSD23
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Mariateresa Caggiano, Concetta Semeraro, Michele Dassisti:
A Metamodel for Designing Assessment Models to support transition of production systems towards Industry 5.0. 104008

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