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ORCIDVST@SANER 2020: London, ON, Canada
- IEEE Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020. IEEE 2020, ISBN 978-1-7281-6271-3
- Zhong Xi Lu, Sten Vercammen
, Serge Demeyer:
Semi-automatic Test Case Expansion for Mutation Testing. 1-7 - Stefan Fischer, Evelyn Nicole Haslinger, Markus Zimmermann, Hannes Thaller:
An Empirical Evaluation for Object Initialization of Member Variables in Unit Testing. 8-11 - Georg Buchgeher, Stefan Fischer, Michael Moser, Josef Pichler:
An Early Investigation of Unit Testing Practices of Component-Based Software Systems. 12-15 - Attila Szatmári, Béla Vancsics, Árpád Beszédes:
Do Bug-Fix Types Affect Spectrum-Based Fault Localization Algorithms' Efficiency? 16-23 - Hannes Thaller, Lukas Linsbauer, Alexander Egyed, Stefan Fischer:
Towards Fault Localization via Probabilistic Software Modeling. 24-27 - Béla Vancsics, Tamás Gergely, Árpád Beszédes:
Simulating the Effect of Test Flakiness on Fault Localization Effectiveness. 28-35
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