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ORCIDPRDC 2012: Niigata, Japan
- IEEE 18th Pacific Rim International Symposium on Dependable Computing, PRDC 2012, Niigata, Japan, November 18-19, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-4849-2
- Miruna Stoicescu, Jean-Charles Fabre, Matthieu Roy:
From Design for Adaptation to Component-Based Resilient Computing. 1-10 - Qiang Guan, Chi-Chen Chiu, Song Fu
:
CDA: A Cloud Dependability Analysis Framework for Characterizing System Dependability in Cloud Computing Infrastructures. 11-20 - Kumiko Tadano, Fumio Machida, Jianwen Xiang, Yoshiharu Maeno:
Identification of Minimal Unacceptable Combinations of Simultaneous Component Failures in Information Systems. 21-30 - Naghmeh Ramezani Ivaki, Filipe Araújo, Raul Barbosa:
A Middleware for Exactly-Once Semantics in Request-Response Interactions. 31-40 - Kenichi Kourai, Takuya Nagata:
A Secure Framework for Monitoring Operating Systems Using SPEs in Cell/B.E. 41-50 - Linbo Chen, Jianhui Jiang, Danqing Zhang:
Code Reuse Prevention through Control Flow Lazily Check. 51-60 - Amina Mekki-Mokhtar, Jean-Paul Blanquart, Jérémie Guiochet, David Powell, Matthieu Roy:
Safety Trigger Conditions for Critical Autonomous Systems. 61-69 - Salvador DeCelles, Nagarajan Kandasamy:
Entropy-Based Detection of Incipient Faults in Software Systems. 70-79 - Tatsuya Noguchi, Tatsuhiro Tsuchiya, Tohru Kikuno:
Safety Verification of Asynchronous Consensus Algorithms with Model Checking. 80-88 - Ken Yano, Takanori Hayashida, Toshinori Sato:
Analysis of SER Improvement by Radiation Hardened Latches. 89-95 - Itsuo Takanami, Tadayoshi Horita:
A Built-in Circuit for Self-Repairing Mesh-Connected Processor Arrays by Direct Spare Replacement. 96-104 - Tomohiro Yoneda, Masashi Imai, Naoya Onizawa, Atsushi Matsumoto, Takahiro Hanyu:
Multi-chip NoCs for Automotive Applications. 105-110 - Masashi Imai, Tomohiro Yoneda:
Performance Modeling and Analysis of On-chip Networks for Real-Time Applications. 111-120 - Tatsuhiro Tsuchiya:
A BDD-Based Approach to Reliability Optimal Module Allocation in Networks. 121-126 - Aromhack Saysanasongkham, Masahiko Negishi, Masayuki Arai, Satoshi Fukumoto:
A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment. 127-134 - Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi, Kewal K. Saluja:
Diagnosis for Bridging Faults on Clock Lines. 135-144
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