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ORCID25th NATW 2016: Providence, RI, USA
- 25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016. IEEE 2016, ISBN 978-1-4673-8949-5
- Yongsuk Choi, Yong-Bin Kim, In-Seok Jung:
A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration. 1-5 - Chen Zhang, Gyunam Jeon, Yongsuk Choi, Yong-Bin Kim, Kyung Ki Kim:
An Area Efficient 4Gb/s Half-Rate 3-Tap DFE with Current-Integrating Summer for Data Correction. 6-11 - Xiao Liu, Changkai Yu, Yu Qi, Yu Huang, James Fu:
Case Study of Testing a SoC Design with Mixed EDT Channel Sharing and Channel Broadcasting. 12-17 - Muralidharan Venkatasubramanian, Vishwani D. Agrawal:
Failures Guide Probabilistic Search for a Hard-to-Find Test. 18-23 - Md. Nazmul Islam
, Sandip Kundu:
Modeling Residual Life of an IC Considering Multiple Aging Mechanisms. 24-27 - Joseph Nguyen, David Turgis, David Bonciani, Brice Lhomme, Yann Carminati, Olivier Callen, Guillaume Guirleo, Lorenzo Ciampolini, Gérard Ghibaudo:
RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. 28-33 - Malinky Ghosh, Kelly A. Ockunzzi:
Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs. 34-37 - Hari Chauhan, Vladimir Kvartenko, Marvin Onabajo:
A Tuning Technique for Temperature and Process Variation Compensation of Power Amplifiers with Digital Predistortion. 38-45 - Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter:
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. 46-52 - Amirhossein Shahshahani, Andrey Tolstikhin, Zeljko Zilic:
Enabling Debug in IoT Wireless Development and Deployment with Security Considerations. 53-58
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