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International Conference on Vehicular Electronics and Safety (ICVES)
ICVES 2022: Bogota, Colombia
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2022, Bogota, Colombia, November 14-16, 2022. IEEE 2022, ISBN 978-1-6654-7698-0 [contents]
ICVES 2019: Cairo, Egypt
- IEEE International Conference of Vehicular Electronics and Safety, ICVES 2019, Cairo, Egypt, September 4-6, 2019. IEEE 2019, ISBN 978-1-7281-3473-4 [contents]
ICVES 2018: Madrid, Spain
- 2018 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2018, Madrid, Spain, September 12-14, 2018. IEEE 2018, ISBN 978-1-5386-3543-8 [contents]
ICVES 2017: Vienna, Austria
- 2017 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2017, Vienna, Austria, June 27-28, 2017. IEEE 2017, ISBN 978-1-5090-5677-4 [contents]
ICVES 2016: Beijing, China
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2016, Beijing, China, July 10-12, 2016. IEEE 2016, ISBN 978-1-5090-2933-4 [contents]
ICVES 2015: Yokohama, Japan
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2015, Yokohama, Japan, November 5-7, 2015. IEEE 2015, ISBN 978-1-4673-9114-6 [contents]
ICVES 2014: Hyderabad, India
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2014, Hyderabad, India, December 16-17, 2014. IEEE 2014, ISBN 978-1-4799-1882-9 [contents]
ICVES 2013: Dongguan, China
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2013, Dongguan, China, 28-30 July, 2013. IEEE 2013, ISBN 978-1-4799-0379-5 [contents]
ICVES 2012: Istanbul, Turkey
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2012, Istanbul, Turkey, 24-27 July, 2012. IEEE 2012, ISBN 978-1-4673-0992-9 [contents]
ICVES 2009: Pune, India
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2009, Pune, India, 11-12 November, 2009. IEEE 2009, ISBN 978-1-4244-5442-6 [contents]
ICVES 2008: Columbus, OH, USA
- IEEE International Conference on Vehicular Electronics and Safety, ICVES 2008, Columbus, OH, USA, 22-24 September, 2008. IEEE 2008, ISBN 978-1-4244-2359-0 [contents]
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