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ORCIDAIEE-IRE Computer Conference (Eastern) 1953: Washington, DC, USA
- John H. Howard:
Papers and discussions presented at the 1953 eastern joint AIEE-IRE computer conference - information processing systems - reliability and requirements, AIEE-IRE 1953 (Eastern), Washington, D.C., USA, December 8-10, 1953. ACM 1953, ISBN 978-1-4503-7853-6
Reports of group discussions
- Howard T. Engstrom:
Keynote address. 7
Technical papers
- Thomas H. Briggs:
The RETMA support of the 1950 computer conference: a progress report. 8-10 - M. E. Davis:
The use of electronic data processing systems in the life insurance business. 11-18 - Vernon I. Weihe:
Computer applications in air traffic control. 18-22 - Joseph Smagorinsky:
Data processing requirements for the purposes of numerical weather prediction. 22-30 - L. D. Whitelock:
Methods used to improve reliability in military electronics equipment. 31-33 - Ralph B. Conn:
Digital computers for linear, real-time control systems. 33-37 - William N. Papian:
The MIT magnetic-core memory. 37-42 - Robert W. House:
Reliability experience on the OARAC. 43-45 - Willard G. Bouricius:
Operating experience with the Los Alamos 701. 45-47 - Francis J. Murray:
Acceptance test for Raytheon hurricane computer. 48-52 - Bernard Loveman:
Reliability of a large REAC installation. 53-57 - S. N. Alexander, R. D. Elbourn:
Computer performance tests employed by the National Bureau of Standards. 58-61 - Robert Kopp:
Experience on the Air Force UNIVAC. 62-67 - J. A. Goetz, H. J. Geisler:
Electron tube and crystal diode experience in computing equipment. 67-72 - Joseph M. Wier:
Reliability and characteristics of the Illiac electrostatic memory. 72-77 - D. W. Sharp:
Electron tube performance in some typical military environments. 77-83 - Phil D. Shupe Jr., Russell A. Kirsch:
SEAC: review of three years of operation. 83-90 - Charles R. Williams:
A review of ORDVAC operating experience. 91-95 - Herman H. Goldstine:
Some remarks on logical design and programming checks. 96-98 - John W. Mauchly:
The advantages of built-in checking. 99-101 - J. C. Chapman, W. W. Wetzel:
Recent progress in the production of error-free magnetic computer tape. 102-104 - Mark VanBuskirk:
Reliability of electrolytic capacitors in computers. 105-109 - Jesse Marsten:
Resistor reliability - whose responsibility?: some case histories. 109-112 - Enoch B. Ferrell:
Reliability and its relation to suitability and predictability. 113-116 - Allen V. Astin:
Summary of AIEE-IRE-ACM conference. 116-118
Reports of group discussions
- J. J. Eachus:
Group discussion on diagnostic checks. 119 - Ralph J. Slutz:
Group discussion on crystal diodes. 120 - George W. Petrie III:
Group discussion on technical applications. 121 - Allen Shoup:
Group discussion on magnetic-tape standards. 121-122 - W. F. Frese:
Group discussion on commercial and industrial applications of computers. 123 - Herbert R. J. Grosch:
After-luncheon remarks. 124-125
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